Tsukada Hirotaka, Tsuji Taishi, Satoh Nobuo, "Nanoscale Analysis of Power Semiconductor Devices by using Multi-Purpose Scanning Probe Microscope",
The 10th International Symposium on Surface Science(ISSS-10), Kitakyushu International Conference Center, [3P01-15] (2024/10/22).
Hirotaka Tsukada, Daigo Sato, Nobuo Satoh, “Visualization of Internal Current Path in Power Semiconductor Devices Using a Multi-function Scanning Probe Microscope”,
33rd International Colloquium on Scanning Probe Microscopy(ICSPM-33), Hotel Sunvalley Nasu, [S8-2] (2025/12/12).